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Critical variables of solder paste stencil printing for micro-BGA and fine-pitch QFP

机译:微型BGA和细间距QFP的锡膏模版印刷的关键变量

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摘要

Stencil printing continues to be the dominant method of solder deposition in high-volume surface-mount assembly. Control of the amount of solder paste deposited is critical in the case of fine-pitch and ultrafine-pitch surface-mount assembly. The process is still not well understood as indicated by the fact that industry reports 52-71% surface-mount technology (SMT) defects are related to the solder paste stencil printing process. The purpose of this paper is to identify the critical variables that influence the volume, area, and height of solder paste deposited. An experiment was conducted to investigate the effects of relevant process parameters on the amount of solder paste deposited for ball grid arrays (BGAs) and quad flat packages (QFPs) of five different pitches ranging from 0.76 mm (30 mil) to 0.3 mm (12 mil). The effects of aperture size, aperture shape, board finish, stencil thickness, solder type, and print speed were examined. The deposited solder paste was measured by an inline fully automatic laser-based three-dimensional (3-D) triangulation solder paste inspection system. Analysis of variance (ANOVA) shows that aperture size and stencil thickness are the two most critical variables. A linear relationship between transfer ratio (defined as the ratio of the deposited paste volume to the stencil aperture volume) and area ratio (defined as the ratio of the area of the aperture opening to the area of the aperture wall) is proposed. The analysis indicates that the selection of a proper stencil thickness is the key to controlling the amount of solder paste deposited, and that the selection of maximum stencil thickness should be based on the area ratio. The experimental results are shown to be consistent with a theoretical model, which are also described.
机译:模板印刷仍然是大批量表面安装组件中焊料沉积的主要方法。在细间距和超细间距表面安装组件的情况下,控制焊膏沉积量至关重要。业内报告52-71%的表面贴装技术(SMT)缺陷与焊膏模版印刷工艺有关,这一事实仍未很好地理解该工艺。本文的目的是确定影响沉积的焊膏的体积,面积和高度的关键变量。进行了一项实验,以研究相关工艺参数对球栅阵列(BGA)和四方扁平封装(QFP)沉积的锡膏量的影响,这些锡膏的间距范围为0.76 mm(30 mil)至0.3 mm(12)密尔)。检查了孔尺寸,孔形状,板表面处理,模板厚度,焊料类型和印刷速度的影响。通过在线全自动基于激光的三维(3-D)三角剖分锡膏检查系统测量沉积的锡膏。方差分析(ANOVA)表明,孔径大小和模板厚度是两个最关键的变量。提出了转移比率(定义为沉积的浆料体积与模板孔体积的比率)和面积比率(定义为孔开口面积与孔壁面积的比率)之间的线性关系。分析表明,选择合适的模板厚度是控制焊膏沉积量的关键,最大模板厚度的选择应基于面积比。实验结果表明与理论模型是一致的,并对此进行了描述。

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